xmlui.ArtifactBrowser.ItemViewer.show_simple

dc.creatorŠetrajčić, Jovan P.
dc.creatorJaćimovski, Stevo
dc.date.accessioned2019-03-21T16:10:17Z
dc.date.available2019-03-21T16:10:17Z
dc.date.issued2017
dc.identifier.issn0022-3697
dc.identifier.urihttp://jakov.kpu.edu.rs/handle/123456789/780
dc.description.abstractThis paper presents the results of research conducted in the field of confinement effects in ultrathin dielectric films. Method of choice is the method of Green's functions which proved to be a very powerful tool for theoretical research in solid state physics. Among many other properties of materials, such as optical, conductive, etc. with this method it is possible to obtain critical values of boundary parameters corresponding to all transitions from bulk to localized exciton states. This research is valid for four layered crystalline film, since that type of ultrathin structure was the object of research. Conditions for occurrence of one, two, three, or even four localized states have been found and analyzed and regions with equal number of localized states have been defined. This corresponds to the process of reconstruction of the energy spectra of excitons in quasi 2D nanostructures with respect to those in corresponding bulk-structures.en
dc.publisherPergamon-Elsevier Science Ltd, Oxford
dc.relationinfo:eu-repo/grantAgreement/MESTD/Basic Research (BR or ON)/171039/RS//
dc.relationinfo:eu-repo/grantAgreement/MESTD/Technological Development (TD or TR)/34019/RS//
dc.relationMinistry of Science and Technological Development of the Republic of Srpska
dc.relationProvincial Secretariat for High Education, Science and Technological Development of Vojvodina
dc.rightsrestrictedAccess
dc.sourceJournal of physics and chemistry of solids
dc.subjectUltrathin filmsen
dc.subjectExcitonsen
dc.subjectEnergy spectraen
dc.subjectLocalized states regionsen
dc.titleDifferent regions of exciton localized states in ultrathin dielectric filmsen
dc.typearticle
dc.rights.licenseARR
dcterms.abstractШетрајчић, Јован П.; Јаћимовски, Стево;
dc.citation.volume105
dc.citation.spage1
dc.citation.epage8
dc.citation.other105: 1-8
dc.citation.rankM22
dc.identifier.doi10.1016/j.jpcs.2017.02.001
dc.identifier.scopus2-s2.0-85012198741
dc.identifier.wos000399866500001
dc.type.versionpublishedVersion


xmlui.dri2xhtml.METS-1.0.item-files-head

Thumbnail

xmlui.ArtifactBrowser.ItemViewer.head_parent_collections

xmlui.ArtifactBrowser.ItemViewer.show_simple